Field Emission Scanning Electron Microscopesem4000PRO

• Customization: Available
• Warranty: 1 Year
• Magnification: >1000X
• Model NO.: SEM4000Pro
• Number of Cylinder: Binoculars
• Mobility: Desktop
• Stereoscopic Effect: Without Stereoscopic Effect
• Kind of Light Source: Ordinary Light
• Shape: Rectangular Prism
• Usage: Research
• Principle: Optics
• Principle of Optics: Phase Contrast Microscope
• Resolution1: 0.9 Nm @ 30 Kv, Se
• Resolution2: 2.5 Nm @ 30 Kv, Bse, 30 PA
• Resolution3: 1.5 Nm @ 30 Kv, Se, 30 PA
• Acceleration Voltage: 0.2 ~ 30 Kv
• Magnification1: 1 ~ 1, 000, 000 X
• Transport Package: Wooden Packing
• Specification: 1.5 CBM
• Origin: China
• HS Code: 9012100000
• Production Capacity: 10000/ Year

Product Description

Field Emission Scanning Electron Microscope SEM4000Pro

Product Paramenters:
       

Analytical field emission scanning electron microscope (FESEM) equipped with a high-brightness long-life Schottky field emission electron gun

 

With the three-stage condenser electron optics column design for beam currents up to 200 nA, SEM4000Pro delivers advantages in EDS, EBSD, WDS, and other analytical applications. The system supports low vacuum mode as well as a high-performance low-vacuum secondary electron detector and retractable backscattered electron detector, which can help directly observe poorly conductive or even non-conductive samples.

Standard optical navigation mode and an intuitive user operation interface make your analysis work easy.

 
Product Speciffcations

Key Parameters	Resolution	High Vacuum	0.9 nm @ 30 kV, SE
		Low Vacuum	2.5 nm @ 30 kV, BSE, 30 Pa
			1.5 nm @ 30 kV, SE, 30 Pa
		Acceleration Voltage	0.2 ~ 30 kV
		Magnification	1 ~ 1,000,000 x
		Electron Gun Type	High Brightness Schottky Field Emission Electron Gun
		Vacuum System	Fully Automated Control
Specimen Chamber		Low Vacuum (Optional)	Max 180Pa
		Camera	Dual Cameras (Optical navigation + chamber monitoring)
		Distance	X: 110 mm Y: 110 mm Z: 65 mm T: -10°~ +70° R: 360°
		Standard	Everhart-Thornley Detector (ETD) Low Vacuum Detector (LVD) Backscattered Electron Detector (BSED)
Detectors and Extensions		Optional	STEM Detector
			Energy Dispersive Spectrometer (EDS)
			Electron Backscatter Diffraction Pattern (EBSD)
			Specimen Exchange Loadlock
			Trackball & Knob Control Panel
Software		Languages	English
		Operating System	Windows
		Navigation	Nav-Cam, Gesture Navigation
		Automatic Functions	Auto Brightness & Contrast, Auto Focus, Auto Stigmator

Product Advantages

 

• Equipped with high brightness and long-life Schottky field emission electron gun

• High resolution of 0.9nm at 30 kV

• Three-stage condenser lens design, wide beam current adjustable range with max beam currents up to 200 nA

• Standard low vacuum mode, high-performance low vacuum secondary electron detector, and retractable backscattered electron detector

• Non-immersion magnetic field free objective lens design, can directly observe magnetic specimens

• Standard optical navigation mode

 

Application

CUSTOMER STORIES               

  CIQTEK SEM Microscope SEM3200 at Loughborough University, UK             SEM Microscope SEM3200 at the University of Monterrey, Mexico

  CIQTEK SEM Microscope SEM3200 at the GSEM Testing Center, Korea                 CIQTEK SEM Microscope SEM3200 User FAQ by SciMed, UK