Cost-Effective Scanning Electron Microscope with Oxford Eds Material Analysis

Product Details
Customization: Available
Magnification: >1000X
Type: Stereomicroscope
Gold Member Since 2019

Suppliers with verified business licenses

Audited Supplier

Audited by an independent third-party inspection agency

to see all verified strength labels (12)
  • Cost-Effective Scanning Electron Microscope with Oxford Eds Material Analysis
  • Cost-Effective Scanning Electron Microscope with Oxford Eds Material Analysis
  • Cost-Effective Scanning Electron Microscope with Oxford Eds Material Analysis
  • Cost-Effective Scanning Electron Microscope with Oxford Eds Material Analysis
  • Cost-Effective Scanning Electron Microscope with Oxford Eds Material Analysis
  • Cost-Effective Scanning Electron Microscope with Oxford Eds Material Analysis
Find Similar Products

Basic Info.

Model NO.
SEM3200
Number of Cylinder
Binoculars
Mobility
Desktop
Stereoscopic Effect
Without Stereoscopic Effect
Kind of Light Source
Ordinary Light
Shape
Rectangular Prism
Usage
Research
Principle
Optics
Principle of Optics
Phase Contrast Microscope
Magnification2
1~300, 000X(Film)
Magnification3
1~1000, 000X(Screen)
Acceleratingvoltage
0.2kv~30kv
Size1
L3000xw4000xh2300mm
Weight (Kg)
50kg
Electricalpower
AC220V(±10%), 50Hz, 2kVA
Transport Package
Wooden Packing
Specification
1.5 CBM
Origin
China
HS Code
9012100000
Production Capacity
10000/ Year

Product Description

 Scanning Electron Microscope SEM3200


Product Paramenters:
       
Cost-Effective Scanning Electron Microscope with Oxford Eds Material Analysis
SEM3200 is a tungsten filament scanning electron microscope
with high performance and wide application.
It has excellent imaging quality capabilities in both high and
low vacuum modes. It also has a large depth of field with a
user friendly environment to characterize samples.What's
more, rich scalability helps the users to explore the world of
microscopic imaging.
 
Model SEM3200A SEM3200
Electronoptical Electrongun Pre-alignedmedium-sizedfork-typetungstenfilament
system Resolution Highvacuum 3nm@30kV(SE)
  4nm@30kV(BSE)
  8nm@3kV(SE)
  *Lowvacuum 3nm@30kV(SE)
  Magnification 1~300,000x(film)
  1~1000,000x(screen)
  Acceleratingvoltage 0.2kV~30kV
Imagingsystem Detector Secondaryelectrondetector(ETD)
*EBSD,*LowvacuumSED,*EDS
Imageformat TIFF,JPG,BMP,PNG
Vacuumsystem Vacuummode Highvacuum Betterthan5×10-4Pa
*Lowvacuum 5~1000Pa
Controlmode Fullautomatic
Turbomolecularpump ≥240L/S
Mechanicalpump 200L/min(50Hz)
Sampleroom Camera Opticalnavigation
Monitoring
Samplestage Threeaxisautomatic Fiveaxisautomatic
Distance X:120mm X:120mm
Y:115mm Y:115mm
Z:50mm Z:50mm
/ R:360°
/ T:-10°~+90°
Software Language Chinese/English
OS Windows
Navigation Opticalnavigation,gesturequicknavigation
Automaticfunction Autobrightnesscontrast,autofocus,autoastigmatism
Featuredfunction Intelligentassistedastigmatism,maximumimageMosaic(optionalsoftware)
Installation Size L≥3000mm,W≥4000mm,H≥2300mm
Requirements Temperature 20ºC~25ºC
  Humidity ≤50%
  Electricalpower AC220V(±10%),50Hz,2kVA
Product Features
 
Low voltage
For carbon material samples, at low voltage, the penetration depth is small, and the true morphology of the sample surface can be
obtained with richer details.
Cost-Effective Scanning Electron Microscope with Oxford Eds Material Analysis
For hair samples, at low voltage, the damage of electron beam irradiation is reduced and the charge effect is eliminated.

Cost-Effective Scanning Electron Microscope with Oxford Eds Material Analysis
Low vacuum
The filter fiber tube material has poor electrical conductivity and obvious charge under high vacuum. Under low vacuum,
the non-conductive sample can be directly observed without coating.
Cost-Effective Scanning Electron Microscope with Oxford Eds Material Analysis
Rich scalability
Scanning electron microscope is not only limited to the observation of surface morphology, but also can be used to analyze
the micro-components of the sample surface.
In addition to conventional secondary electron detector (ETD), backscattered electron detector (BSED), and X-ray energy
dispersive spectrometer (EDS), many interfaces are reserved, such as electron backscattered diffraction (EBSD), cathode ray (CL)
detectors can be integrated on SEM3200.
Backscattered electron detector
In the backscattered electron imaging mode, the charge effect is weakened obviously, and more composition information
can be obtained on the sample surface.
Coating sample:
Cost-Effective Scanning Electron Microscope with Oxford Eds Material Analysis
Application
Cost-Effective Scanning Electron Microscope with Oxford Eds Material AnalysisCost-Effective Scanning Electron Microscope with Oxford Eds Material AnalysisCost-Effective Scanning Electron Microscope with Oxford Eds Material Analysis

CUSTOMER STORIES               

Cost-Effective Scanning Electron Microscope with Oxford Eds Material Analysis
  CIQTEK SEM Microscope SEM3200 at Loughborough University, UK             SEM Microscope SEM3200 at the University of Monterrey, Mexico

Cost-Effective Scanning Electron Microscope with Oxford Eds Material Analysis  CIQTEK SEM Microscope SEM3200 at the GSEM Testing Center, Korea                 CIQTEK SEM Microscope SEM3200 User FAQ by SciMed, UK

 

Particle & Pore Analysis Software (Particle) *Optional

Cost-Effective Scanning Electron Microscope with Oxford Eds Material Analysis
 

The CIQTEK SEM Microscope software employs various target detection and segmentation algorithms, suitable for different types of particle and pore samples. it enables quantitative analysis of particle and pore statistics and can be applied in fields such as materials science, geology, and environmental science.

Image Post-processing Software

Cost-Effective Scanning Electron Microscope with Oxford Eds Material Analysis

Perform online or offline image post-processing on images captured by electron microscopes and integrates commonly used EM image processing functions, convenient measurement andannotation tools.

 

 


 

Send your message to this supplier

*From:
*To:
*Message:

Enter between 20 to 4,000 characters.

This is not what you are looking for? Post a Sourcing Request Now
Contact Supplier