China High-Performance Tungsten Filament Scanning Electron Microscope

• Customization: Available
• After-sales Service: One Year
• Warranty: One Year
• Model NO.: SEM3200
• Magnification: >1000X
• Type: Stereomicroscope
• Number of Cylinder: Binoculars
• Mobility: Desktop
• Stereoscopic Effect: Without Stereoscopic Effect
• Kind of Light Source: Ordinary Light
• Shape: Rectangular Prism
• Usage: Research
• Principle: Optics
• Principle of Optics: Phase Contrast Microscope
• Magnification2: 1~300, 000X(Film)
• Magnification3: 1~1000, 000X(Screen)
• Acceleratingvoltage: 0.2kv~30kv
• Size1: L3000xw4000xh2300mm
• Weight (Kg): 50kg
• Electricalpower: AC220V(±10%), 50Hz, 2kVA
• Transport Package: Wooden Packing
• Specification: 1.5 CBM
• Origin: China
• HS Code: 9012100000
• Production Capacity: 10000/ Year

Product Description

 Scanning Electron Microscope SEM3200


Product Paramenters:
       

SEM3200 is a tungsten filament scanning electron microscope

with high performance and wide application.

It has excellent imaging quality capabilities in both high and

low vacuum modes. It also has a large depth of field with a

user friendly environment to characterize samples.What's

more, rich scalability helps the users to explore the world of

microscopic imaging.

 

Model			SEM3200A	SEM3200
Electronoptical	Electrongun		Pre-alignedmedium-sizedfork-typetungstenfilament
system	Resolution	Highvacuum	3nm@30kV(SE)
			4nm@30kV(BSE)
			8nm@3kV(SE)
		*Lowvacuum	3nm@30kV(SE)
	Magnification		1~300,000x(film)
			1~1000,000x(screen)
	Acceleratingvoltage		0.2kV~30kV
Imagingsystem	Detector		Secondaryelectrondetector(ETD)
			*EBSD,*LowvacuumSED,*EDS
	Imageformat		TIFF,JPG,BMP,PNG
Vacuumsystem	Vacuummode	Highvacuum	Betterthan5×10-4Pa
		*Lowvacuum	5~1000Pa
	Controlmode		Fullautomatic
	Turbomolecularpump		≥240L/S
	Mechanicalpump		200L/min(50Hz)
Sampleroom	Camera		Opticalnavigation
			Monitoring
	Samplestage		Threeaxisautomatic	Fiveaxisautomatic
	Distance		X:120mm	X:120mm
			Y:115mm	Y:115mm
			Z:50mm	Z:50mm
			/	R:360°
			/	T:-10°~+90°
Software	Language		Chinese/English
	OS		Windows
	Navigation		Opticalnavigation,gesturequicknavigation
	Automaticfunction		Autobrightnesscontrast,autofocus,autoastigmatism
	Featuredfunction		Intelligentassistedastigmatism,maximumimageMosaic(optionalsoftware)
Installation	Size		L≥3000mm,W≥4000mm,H≥2300mm
Requirements	Temperature		20ºC~25ºC
	Humidity		≤50%
	Electricalpower		AC220V(±10%),50Hz,2kVA

Product Features
 

Low voltage

For carbon material samples, at low voltage, the penetration depth is small, and the true morphology of the sample surface can be

obtained with richer details.

For hair samples, at low voltage, the damage of electron beam irradiation is reduced and the charge effect is eliminated.

Low vacuum

The filter fiber tube material has poor electrical conductivity and obvious charge under high vacuum. Under low vacuum,

the non-conductive sample can be directly observed without coating.

Rich scalability

Scanning electron microscope is not only limited to the observation of surface morphology, but also can be used to analyze

the micro-components of the sample surface.

In addition to conventional secondary electron detector (ETD), backscattered electron detector (BSED), and X-ray energy

dispersive spectrometer (EDS), many interfaces are reserved, such as electron backscattered diffraction (EBSD), cathode ray (CL)

detectors can be integrated on SEM3200.

Backscattered electron detector

In the backscattered electron imaging mode, the charge effect is weakened obviously, and more composition information

can be obtained on the sample surface.

Coating sample:

Application

CUSTOMER STORIES               

  CIQTEK SEM Microscope SEM3200 at Loughborough University, UK             SEM Microscope SEM3200 at the University of Monterrey, Mexico

  CIQTEK SEM Microscope SEM3200 at the GSEM Testing Center, Korea                 CIQTEK SEM Microscope SEM3200 User FAQ by SciMed, UK
 

Particle & Pore Analysis Software (Particle) *Optional

 

The CIQTEK SEM Microscope software employs various target detection and segmentation algorithms, suitable for different types of particle and pore samples. it enables quantitative analysis of particle and pore statistics and can be applied in fields such as materials science, geology, and environmental science.

Image Post-processing Software

Perform online or offline image post-processing on images captured by electron microscopes and integrates commonly used EM image processing functions, convenient measurement andannotation tools.