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Chinese Sem Scanning Electron Microscope Replace Zeiss, Hitachi and Other Brands

Product Details
Magnification: >1000X
Type: Stereomicroscope
Number of Cylinder: Binoculars
  • Chinese Sem Scanning Electron Microscope Replace Zeiss, Hitachi and Other Brands
  • Chinese Sem Scanning Electron Microscope Replace Zeiss, Hitachi and Other Brands
  • Chinese Sem Scanning Electron Microscope Replace Zeiss, Hitachi and Other Brands
  • Chinese Sem Scanning Electron Microscope Replace Zeiss, Hitachi and Other Brands
  • Chinese Sem Scanning Electron Microscope Replace Zeiss, Hitachi and Other Brands
  • Chinese Sem Scanning Electron Microscope Replace Zeiss, Hitachi and Other Brands
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Basic Info.

Model NO.
SEM3200
Mobility
Desktop
Stereoscopic Effect
Without Stereoscopic Effect
Kind of Light Source
Ordinary Light
Shape
Rectangular Prism
Usage
Research
Principle
Optics
Principle of Optics
Phase Contrast Microscope
Magnification2
1~300, 000X(Film)
Magnification3
1~1000, 000X(Screen)
Acceleratingvoltage
0.2kv~30kv
Size1
L3000xw4000xh2300mm
Weight (Kg)
50kg
Electricalpower
AC220V(±10%), 50Hz, 2kVA
Transport Package
Wooden Packing
Specification
1.5 CBM
Origin
China
HS Code
9012100000
Production Capacity
10000/ Year

Product Description

 Scanning Electron Microscope SEM3200


Product Paramenters:
       
Chinese Sem Scanning Electron Microscope Replace Zeiss, Hitachi and Other Brands
SEM3200 is a tungsten filament scanning electron microscope
with high performance and wide application.
It has excellent imaging quality capabilities in both high and
low vacuum modes. It also has a large depth of field with a
user friendly environment to characterize samples.What's
more, rich scalability helps the users to explore the world of
microscopic imaging.
 
ModelSEM3200ASEM3200
ElectronopticalElectrongunPre-alignedmedium-sizedfork-typetungstenfilament
systemResolutionHighvacuum3nm@30kV(SE)
 4nm@30kV(BSE)
 8nm@3kV(SE)
 *Lowvacuum3nm@30kV(SE)
 Magnification1~300,000x(film)
 1~1000,000x(screen)
 Acceleratingvoltage0.2kV~30kV
ImagingsystemDetectorSecondaryelectrondetector(ETD)
*EBSD,*LowvacuumSED,*EDS
ImageformatTIFF,JPG,BMP,PNG
VacuumsystemVacuummodeHighvacuumBetterthan5×10-4Pa
*Lowvacuum5~1000Pa
ControlmodeFullautomatic
Turbomolecularpump≥240L/S
Mechanicalpump200L/min(50Hz)
SampleroomCameraOpticalnavigation
Monitoring
SamplestageThreeaxisautomaticFiveaxisautomatic
DistanceX:120mmX:120mm
Y:115mmY:115mm
Z:50mmZ:50mm
/R:360°
/T:-10°~+90°
SoftwareLanguageChinese/English
OSWindows
NavigationOpticalnavigation,gesturequicknavigation
AutomaticfunctionAutobrightnesscontrast,autofocus,autoastigmatism
FeaturedfunctionIntelligentassistedastigmatism,maximumimageMosaic(optionalsoftware)
InstallationSizeL≥3000mm,W≥4000mm,H≥2300mm
RequirementsTemperature20ºC~25ºC
 Humidity≤50%
 ElectricalpowerAC220V(±10%),50Hz,2kVA
Product Features
 
Low voltage
For carbon material samples, at low voltage, the penetration depth is small, and the true morphology of the sample surface can be
obtained with richer details.
Chinese Sem Scanning Electron Microscope Replace Zeiss, Hitachi and Other Brands
For hair samples, at low voltage, the damage of electron beam irradiation is reduced and the charge effect is eliminated.

Chinese Sem Scanning Electron Microscope Replace Zeiss, Hitachi and Other Brands
Low vacuum
The filter fiber tube material has poor electrical conductivity and obvious charge under high vacuum. Under low vacuum,
the non-conductive sample can be directly observed without coating.
Chinese Sem Scanning Electron Microscope Replace Zeiss, Hitachi and Other Brands
Rich scalability
Scanning electron microscope is not only limited to the observation of surface morphology, but also can be used to analyze
the micro-components of the sample surface.
In addition to conventional secondary electron detector (ETD), backscattered electron detector (BSED), and X-ray energy
dispersive spectrometer (EDS), many interfaces are reserved, such as electron backscattered diffraction (EBSD), cathode ray (CL)
detectors can be integrated on SEM3200.
Backscattered electron detector
In the backscattered electron imaging mode, the charge effect is weakened obviously, and more composition information
can be obtained on the sample surface.
Coating sample:
Chinese Sem Scanning Electron Microscope Replace Zeiss, Hitachi and Other Brands
Application
Chinese Sem Scanning Electron Microscope Replace Zeiss, Hitachi and Other BrandsChinese Sem Scanning Electron Microscope Replace Zeiss, Hitachi and Other BrandsChinese Sem Scanning Electron Microscope Replace Zeiss, Hitachi and Other Brands

CUSTOMER STORIES               

Chinese Sem Scanning Electron Microscope Replace Zeiss, Hitachi and Other Brands
  CIQTEK SEM Microscope SEM3200 at Loughborough University, UK             SEM Microscope SEM3200 at the University of Monterrey, Mexico

Chinese Sem Scanning Electron Microscope Replace Zeiss, Hitachi and Other Brands  CIQTEK SEM Microscope SEM3200 at the GSEM Testing Center, Korea                 CIQTEK SEM Microscope SEM3200 User FAQ by SciMed, UK

 

Particle & Pore Analysis Software (Particle) *Optional

Chinese Sem Scanning Electron Microscope Replace Zeiss, Hitachi and Other Brands
 

The CIQTEK SEM Microscope software employs various target detection and segmentation algorithms, suitable for different types of particle and pore samples. it enables quantitative analysis of particle and pore statistics and can be applied in fields such as materials science, geology, and environmental science.

Image Post-processing Software

Chinese Sem Scanning Electron Microscope Replace Zeiss, Hitachi and Other Brands

Perform online or offline image post-processing on images captured by electron microscopes and integrates commonly used EM image processing functions, convenient measurement andannotation tools.

 

 


 

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