Upright Trinocular Binocular Computerized Optical Metallurgical Microscope for Analyzing and Measuring Materials

Product Details
Customization: Available
After-sales Service: 1 Year
Warranty: 1 Year
Gold Member Since 2019

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  • Upright Trinocular Binocular Computerized Optical Metallurgical Microscope for Analyzing and Measuring Materials
  • Upright Trinocular Binocular Computerized Optical Metallurgical Microscope for Analyzing and Measuring Materials
  • Upright Trinocular Binocular Computerized Optical Metallurgical Microscope for Analyzing and Measuring Materials
  • Upright Trinocular Binocular Computerized Optical Metallurgical Microscope for Analyzing and Measuring Materials
  • Upright Trinocular Binocular Computerized Optical Metallurgical Microscope for Analyzing and Measuring Materials
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Basic Info.

Model NO.
BH200M
Type
Biological
Number of Cylinder
Binoculars
Mobility
Desktop
Stereoscopic Effect
Stereoscopic Effect
Kind of Light Source
Ordinary Light
Shape
Rectangular Prism
Usage
Teaching, Research
Principle
Optics
Principle of Optics
Polarizing Microscope
Transport Package
Carton Packing
Specification
0.5 CBM
Origin
China
HS Code
9011100000
Production Capacity
10000/ Year

Product Description

BH200M basic metallographic microscope, ultra-high cost performance, can meet the routine metallographic analysis, material observation, semiconductor core state detection and other analysis, can also be used for precision dimensional measurement
 
Optical system Optical systems corrected for finite distance chromatic aberration
Viewing cylinder Hinged binocular, 30° tilt, 360° rotation, pupil distance adjustment range: 54-75mm, bilateral ±5 diopter adjustable;
Hinged triocular, fixed beam splitting ratio, binocular: triocular =80%:20%
Eyepiece PL10X high-point flat field eyepiece with a line field of view of 18mm
Objective lens Long working anomaly field achromatic metallographic objective 5X, 10X, 20X, 50X, 100X
Converter Internally positioned four-hole converters
Internal positioning five-hole converter
Focusing mechanism Coarse fine-tuning coaxial, with mechanical upper limit and elastic adjustment device, coarse adjustment stroke 28mm, fine-tuning accuracy 0.002mm
Stage Double-layer mechanical moving platform with 180X145mm flat platform, moving range: 76mmX50mm
Lighting system Reflection type Cora lighting, adaptive wide voltage 90V-24V, 6V/30W halogen lamp, light intensity continuously adjustable, with variable aperture diaphragm and field of view diaphragm, field of view diaphragm center adjustable
Photographic installation Photographic socket (with PK bayonet), 3.2X photographic eyepiece
Camera unit 0.35X/0.5X/1.0X C type camera socket
Other optional features Easy polarizing
6V30W transmission lighting system

Product details
The flat field achromatic optical system and the fall-out Cora lighting system are used, and the design is in the fall-out lighting system
The anti-reflection structure effectively prevents the reflected light from interfering with the imaging light, thus making the imaging clearer and the field of view contrast better.

Product features:
1. Provide a stable and reliable operating mechanism, so that the imaging is clearer and the operation is easier.
2. The microscope mirror body adopts a new ergonomic design, symmetrical structure, to achieve the expansion of the mirror body building blocks.
3. Low level operation of table, light intensity and coarse fine-tuning, improve the comfort of use.
4. Widely used in various semiconductor silicon wafer testing, material science research, geological mineral analysis and precision engineering and other disciplines.



effect picture
Upright Trinocular Binocular Computerized Optical Metallurgical Microscope for Analyzing and Measuring MaterialsUpright Trinocular Binocular Computerized Optical Metallurgical Microscope for Analyzing and Measuring MaterialsUpright Trinocular Binocular Computerized Optical Metallurgical Microscope for Analyzing and Measuring MaterialsUpright Trinocular Binocular Computerized Optical Metallurgical Microscope for Analyzing and Measuring Materials

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