Ultra-High Resolution Fesem Sem5000X

• Customization: Available
• Warranty: 1 Year
• Magnification: >1000X
• Model NO.: SEM5000X
• Type: Stereomicroscope
• Number of Cylinder: Binoculars
• Mobility: Desktop
• Stereoscopic Effect: Without Stereoscopic Effect
• Kind of Light Source: Ordinary Light
• Shape: Rectangular Prism
• Usage: Research
• Principle: Optics
• Principle of Optics: Phase Contrast Microscope
• Magnification1: 1~2, 500, 000X
• Acceleration Voltage: 20V~30 Kv
• Resolution1: 0.6nm@15kvse
• Resolution2: 1.0nm @1kv, Se
• Electron Gun Type: Schottky Field Emisslon Electron Gun
• Languages: Chinese/English
• Transport Package: Wooden Packing
• Specification: 1.5 CBM
• Origin: China
• HS Code: 9012100000
• Production Capacity: 10000/ Year

Product Description

Ultra-high Resolution FESEM | SEM5000X


Product Paramenters:
       

Ultra-high resolution Field Emission Scanning Electron Microscopy (FESEM): 0.6 nm@15 kV and 1.0 nm@1 kV

 

The CIQTEK SEM5000X ultra-high resolution FESEM utilizes the upgraded column engineering process, "SuperTunnel" technology, and high-resolution objective lens design to improve low-voltage imaging resolution.

The FESEM SEM5000X specimen chamber ports extend to 16, and the specimen exchange load-lock supports up to 8-inch wafer size (maximum diameter 208 mm), significantly expanding the applications. The advanced scanning modes and enhanced automated functions bring stronger performance and an even more optimized experience.

 
Product Speciffcations

Key Parameters	Resolution	0.6nm@15  kV  SE
		1.0nm @1kV,SE
	Acceleration Voltage	20V~30 kV
	Magnification	1~2,500,000x
	Electron Gun Type	Schottky Field Emisslon Electron Gun
Specimen Chamber	VacuumSystem	Fully automated control
	Cameras	Dual cameras (optical navigation+chamber monltor)
	StageType	5-Axis Mechanical EucentricSpecimen Stage
	Stage range	X=110mm,Y=110   mm,Z=65   mm T:-10*~+70°,R.360°
Detectors and Extensions	Standard	In-lens detector
		Everhart-Thornley Detector(ETD)
	Optional	Retractable Back-Scattered Electron Detector (BSED)
		RetractableScanning Transmlssion Electron MicrosCOpy detector  (STEM)
		Energy Dispersive Spectrometer(EDS)
		Electron BackscatteredDiffraction Pattern(EBSD)
		Specimen exchange loadlock (4°&8"optional)
		Trackball &Knob ControlPane
		Specimen stage tandem deceleration
		Magneticfield &acoustic noiseenclosure system (SEM certified)
Software	Languages	Chinese/English
	Operating System	Windows
	Navigation	Nav-Cam,Gesture Quick Navigation
	Automatic Functions	Auto Brightness &Contrast,Auto Focus,Auto Stigmator

Product Advantages

Product Features

a.Ultra-high resolution imaging with breakthrough 0.6 nm@15 kV and 1.0 nm@1 kV.

b.The focused ion beam column which outputs a highly stable, high-quality ion beam, suitable for high-quality nano-fabrication and TEM specimen preparation.

c.High-precision mechanical eucentric specimen stage, ultra-stable vibration damping design, also available with integral enclosure option, greatly minimized the environmental interference that could impact the resolution.
d.Specimen exchange loadlock with up to 8" wafer size (Maximum 208 mm in diameter), meets the needs of semiconductor and research applications.


 

 

Application

CUSTOMER STORIES               

  CIQTEK SEM Microscope SEM3200 at Loughborough University, UK             SEM Microscope SEM3200 at the University of Monterrey, Mexico

  CIQTEK SEM Microscope SEM3200 at the GSEM Testing Center, Korea                 CIQTEK SEM Microscope SEM3200 User FAQ by SciMed, UK