High Speed Scanning Electron Microscope Hem6000

Product Details
Customization: Available
Warranty: 1 Year
Magnification: >1000X
Gold Member Since 2019

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  • High Speed Scanning Electron Microscope Hem6000
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Basic Info.

Model NO.
HEM6000
Type
Stereomicroscope
Number of Cylinder
Binoculars
Mobility
Desktop
Stereoscopic Effect
Without Stereoscopic Effect
Kind of Light Source
Ordinary Light
Shape
Rectangular Prism
Usage
Research
Principle
Optics
Principle of Optics
Phase Contrast Microscope
Resolution1
1.5 Nm@1 Kv Se
Resolution2
1.5 Nm@1 Kv Se
Resolution3
1.5 Nm@15 Kv Bse
Accelerating Voltage
0.1 Kv~6 Kv (Deceleration Mode)
Accelerating Voltage1
6 Kv~30 Kv (None-Decel Mode)
Accelerating Voltage2
6 Kv~30 Kv (None-Decel Mode)
Transport Package
Wooden Packing
Specification
1.5 CBM
Origin
China
HS Code
9012100000
Production Capacity
10000/ Year

Product Description

High Speed Scanning Electron Microscope | HEM6000



Product Paramenters:
       
High Speed Scanning Electron Microscope Hem6000

High-speed Scanning Electron Microscope for Cross-scale Imaging of Large-volume Specimens

 

CIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed electron beam deflection system, high-voltage sample stage deceleration, dynamic optical axis, and immersion electromagnetic & electrostatic combo objective lens to achieve high-speed image acquisition whilst ensuring nano-scale resolution.

The automated operation process is designed for applications such as a more efficient and smarter large-area high-resolution imaging workflow. The imaging speed can reach 5 times faster than a conventional field emission scanning electron microscope (FESEM).

 
Product Speciffcations

 
CIQTEK High-speed SEM Microscope HEM6000 Specifications HEM6000-Semi HEM6000-Bio HEM6000-Lite
Electron Optics  Resolution 1.5 nm@1 kV SE 1.8 nm@1 kV BSE 1.5 nm@15 kV BSE
Accelerating Voltage 0.1 kv~6 kV (Deceleration mode) 6 kV~30 kV (None-decel mode) 6 kV~30 kV
Magnification 66~1,000,000x
 Electron Gun High brightness Schottky field emission electron gun
Type of Objective Lens Immersion electromagnetic & electrostatic combo objective lens
Electrostatic Deflector Five-stage Four-stage Four-stage
Sample Loading System Vacuum System Fully automatic oil-free vacuum system
Specimen Monitoring Horizontal main chamber monitoring camera; vertical sample exchange loadlock chamber monitoring camera
Maximum Sample Size 4 inches in diameter
Specimen Stage Type Motorized 3-axis specimen stage (*optional piezoelectric driven specimen stage)
Specimen Stage Travel Rang X, Y: 110 mm; Z: 16 mm
Specimen Stage Repeatability X:±0.6 μm;Y:±0.3 μm
Specimen Exchange Full automatic
Sample Exchanging Duration <15 minutes
Loadlock Chamber Cleaning Fully automatic plasma cleaning system
Image Acquisition and Processing Dwell Time 10 ns/pixel
Acquisition Speed 2*100 M pixel/s
 Image Size 16 K*16 K
Detector & Accessories Low Angle Retractable Back-scattered Electron Detector Optional None Standard
Low Angle Back-scattered Electron Detector, Lower mounted Optional Standard None
In-column Overall Electron Detector Standard Optional Optional
In-column High-angle Backscattered Electron Detector Optional Optional Optional
Piezoelectric Driven Specimen Stage Optional Optional Optional
High Resolution Large FOV Mode (SW)  Optional None None
Loadlock Chamber Plasma Cleaning System  Optional Optional Optional
6-inch Specimen Loading System  Optional Optional Optional
Active Anti-vibration Platform  Optional Optional Optional
Al Noise Reduction; Large Area Field Stitching; 3D Reconstruction Optional Optional Optional
User Interface Language English
OS Windows
Navigation Optical navigation, gesture navigation
Automatic Function Automatic sample recognition, automatic imaging area selection, automatic brightness & contrast, automatic focus, automatic stigmator

Product Advantages
High Speed Scanning Electron Microscope Hem6000
 
HEM6000-Semi  HEM6000-Bio HEM6000-Lit
Low voltage & high resolution Low voltage & high resolution Simplified operation
Large field of view Various automated algorithms for the biological field Abundant selection options
Specially optimized algorithms for easy alignment of highly repetitive specimens BSE Detector Optimized for biological applications  High-speed automated workflow
Five-stage electrostatic deflection Biological 3D reconstruction system  

 HIGHLIGHTS
  • High-speed Automation
    Fully automatic sample loading & offloading process and image acquisition operation, which makes the overall imaging speed 5 times faster than that of conventional FESEM
 
  • Large Field of View
    Technology that dynamically shifts the optical axis according to the scanning deflection range, achieves minimum edge distortion
  • Low Imaging Distortion
    Specimen stage tandem deceleration technology, achieves low landing energy, whilst obtaining high-resolution images

High Speed Scanning Electron Microscope Hem6000
 
IMAGE GALLERY
High Speed Scanning Electron Microscope Hem6000

High Speed Scanning Electron Microscope Hem6000High Speed Scanning Electron Microscope Hem6000

CUSTOMER STORIES               


High Speed Scanning Electron Microscope Hem6000
  CIQTEK SEM Microscope SEM3200 at Loughborough University, UK             SEM Microscope SEM3200 at the University of Monterrey, Mexico

High Speed Scanning Electron Microscope Hem6000  CIQTEK SEM Microscope SEM3200 at the GSEM Testing Center, Korea                 CIQTEK SEM Microscope SEM3200 User FAQ by SciMed, UK

 

 

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