High Speed Scanning Electron Microscope Hem6000

• Customization: Available
• Warranty: 1 Year
• Magnification: >1000X
• Model NO.: HEM6000
• Number of Cylinder: Binoculars
• Mobility: Desktop
• Stereoscopic Effect: Without Stereoscopic Effect
• Kind of Light Source: Ordinary Light
• Shape: Rectangular Prism
• Usage: Research
• Principle: Optics
• Principle of Optics: Phase Contrast Microscope
• Resolution1: 1.5 Nm@1 Kv Se
• Resolution2: 1.5 Nm@1 Kv Se
• Resolution3: 1.5 Nm@15 Kv Bse
• Accelerating Voltage: 0.1 Kv~6 Kv (Deceleration Mode)
• Accelerating Voltage1: 6 Kv~30 Kv (None-Decel Mode)
• Accelerating Voltage2: 6 Kv~30 Kv (None-Decel Mode)
• Transport Package: Wooden Packing
• Specification: 1.5 CBM
• Origin: China
• HS Code: 9012100000
• Production Capacity: 10000/ Year

Product Description

High Speed Scanning Electron Microscope | HEM6000

Product Paramenters:
       

High-speed Scanning Electron Microscope for Cross-scale Imaging of Large-volume Specimens

 

CIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed electron beam deflection system, high-voltage sample stage deceleration, dynamic optical axis, and immersion electromagnetic & electrostatic combo objective lens to achieve high-speed image acquisition whilst ensuring nano-scale resolution.

The automated operation process is designed for applications such as a more efficient and smarter large-area high-resolution imaging workflow. The imaging speed can reach 5 times faster than a conventional field emission scanning electron microscope (FESEM).

 
Product Speciffcations
 

CIQTEK High-speed SEM Microscope HEM6000 Specifications		HEM6000-Semi	HEM6000-Bio	HEM6000-Lite
Electron Optics	Resolution	1.5 nm@1 kV SE	1.8 nm@1 kV BSE	1.5 nm@15 kV BSE
	Accelerating Voltage	0.1 kv~6 kV (Deceleration mode)	6 kV~30 kV (None-decel mode)	6 kV~30 kV
	Magnification	66~1,000,000x
	Electron Gun	High brightness Schottky field emission electron gun
	Type of Objective Lens	Immersion electromagnetic & electrostatic combo objective lens
	Electrostatic Deflector	Five-stage	Four-stage	Four-stage
Sample Loading System	Vacuum System	Fully automatic oil-free vacuum system
	Specimen Monitoring	Horizontal main chamber monitoring camera; vertical sample exchange loadlock chamber monitoring camera
	Maximum Sample Size	4 inches in diameter
	Specimen Stage Type	Motorized 3-axis specimen stage (*optional piezoelectric driven specimen stage)
	Specimen Stage Travel Rang	X, Y: 110 mm; Z: 16 mm
	Specimen Stage Repeatability	X:±0.6 μm;Y:±0.3 μm
	Specimen Exchange	Full automatic
	Sample Exchanging Duration	<15 minutes
	Loadlock Chamber Cleaning	Fully automatic plasma cleaning system
Image Acquisition and Processing	Dwell Time	10 ns/pixel
	Acquisition Speed	2*100 M pixel/s
	Image Size	16 K*16 K
Detector & Accessories	Low Angle Retractable Back-scattered Electron Detector	Optional	None	Standard
	Low Angle Back-scattered Electron Detector, Lower mounted	Optional	Standard	None
	In-column Overall Electron Detector	Standard	Optional	Optional
	In-column High-angle Backscattered Electron Detector	Optional	Optional	Optional
	Piezoelectric Driven Specimen Stage	Optional	Optional	Optional
	High Resolution Large FOV Mode (SW)	Optional	None	None
	Loadlock Chamber Plasma Cleaning System	Optional	Optional	Optional
	6-inch Specimen Loading System	Optional	Optional	Optional
	Active Anti-vibration Platform	Optional	Optional	Optional
	Al Noise Reduction; Large Area Field Stitching; 3D Reconstruction	Optional	Optional	Optional
User Interface	Language	English
	OS	Windows
	Navigation	Optical navigation, gesture navigation
	Automatic Function	Automatic sample recognition, automatic imaging area selection, automatic brightness & contrast, automatic focus, automatic stigmator

Product Advantages

 

HEM6000-Semi	HEM6000-Bio	HEM6000-Lit
Low voltage & high resolution	Low voltage & high resolution	Simplified operation
Large field of view	Various automated algorithms for the biological field	Abundant selection options
Specially optimized algorithms for easy alignment of highly repetitive specimens	BSE Detector Optimized for biological applications	High-speed automated workflow
Five-stage electrostatic deflection	Biological 3D reconstruction system

 HIGHLIGHTS

• High-speed Automation

  Fully automatic sample loading & offloading process and image acquisition operation, which makes the overall imaging speed 5 times faster than that of conventional FESEM

 

• Large Field of View

  Technology that dynamically shifts the optical axis according to the scanning deflection range, achieves minimum edge distortion

• Low Imaging Distortion

  Specimen stage tandem deceleration technology, achieves low landing energy, whilst obtaining high-resolution images

 

IMAGE GALLERY

CUSTOMER STORIES               

  CIQTEK SEM Microscope SEM3200 at Loughborough University, UK             SEM Microscope SEM3200 at the University of Monterrey, Mexico

  CIQTEK SEM Microscope SEM3200 at the GSEM Testing Center, Korea                 CIQTEK SEM Microscope SEM3200 User FAQ by SciMed, UK