Field Emission Scanning Electron Microscope Sem5000PRO

• Customization: Available
• Warranty: 1 Year
• Magnification: >1000X
• Model NO.: SEM5000Pro
• Type: Stereomicroscope
• Number of Cylinder: Binoculars
• Mobility: Desktop
• Stereoscopic Effect: Without Stereoscopic Effect
• Kind of Light Source: Ordinary Light
• Shape: Rectangular Prism
• Usage: Research
• Principle: Optics
• Principle of Optics: Phase Contrast Microscope
• Resolution1: 0.8nm @ 15kv
• Resolution2: 1.2nm @ 1kv
• Magnification1: 1 ~ 2, 500, 000 X
• Acceleration Voltage: 0.02 ~ 30 Kv
• Specimen Stage: Five-Axis Automatic
• Transport Package: Wooden Packing
• Specification: 1.5 CBM
• Origin: China
• HS Code: 9012100000
• Production Capacity: 10000/ Year

Product Description

Field Emission Scanning Electron Microscope SEM5000Pro

Product Paramenters:
       

CIQTEK SEM5000Pro is a field emission scanning electron microscope (FESEM) with high-resolution imaging and analysis ability, supported by abundant functions, benefits from advanced electron optics column design, with high-pressure electron beam tunnel technology (SuperTunnel), low aberration, and MFL objective lens, achieves low voltage high-resolution imaging, the magnetic specimen can also be analyzed.

With optical navigation, automated functionalities, carefully designed human-computer interaction user interface, and optimized operation and use process, no matter if you are an expert or not, you can quickly get started and complete high-resolution imaging and analysis work.

 
Product Speciffcations

Key Parameters	Resolution	0.8 nm @ 15 kV, SE
		1.2 nm @ 1.0 kV, SE
	Acceleration Voltage	0.02 ~ 30 kV
	Magnification	1 ~ 2,500,000 x
	Electron Gun Type	High brightness Schottky Field Emission Electron Gun
Specimen Chamber	VacuumSystem	Fully Automatic Control, Oil-free Vacuum System
	Cameras	Dual Cameras (Optical navigation + chamber monitor)
	Stage range	X: 110 mm, Y: 110 mm, Z: 50 mm  T: -10°~ +70°, R: 360°
Detectors and Extensions	Standard	Inlens SE Detector
		Everhart-Thornley Detector (ETD)
	Optional	Retractable Backscattered Electron Detector (BSED)
		Retractable Scanning Transmission Electron Microscope(STEM)
		Energy Dispersive Spectroscopy (EDS, EDX)
		Electron Backscatter Diffraction Pattern (EBSD)
		Airlock
		Trackball & Knob Control Panel
Software	Languages	English
	Operating System	Windows
	Navigation	Nav-Cam, Gesture Navigation
	Automatic Functions	Auto Brightness & Contrast, Auto Focus, Auto Stigmator

Product Advantages

• High-resolution imaging at low accelerating voltage.
• Electromagnetic composite objective improves low-voltage resolution and enables magnetic specimen observation.
• High-pressure tunneling technology (SuperTunnel) ensures low voltage resolution.
• The electronic optical path without crossover effectively reduces system aberration and improves resolution.
• Water-cooled constant temperature objective lens, to ensure the stability, reliability, and repeatability of the objective lens work.
• Magnetic deflected six-hole various aperture system, with automatic switchable apertures, no mechanical adjustment needed, achieves high-resolution imaging or large beam analysis mode through a click-away fast switching.
 

 

Application

CUSTOMER STORIES               

  CIQTEK SEM Microscope SEM3200 at Loughborough University, UK             SEM Microscope SEM3200 at the University of Monterrey, Mexico

  CIQTEK SEM Microscope SEM3200 at the GSEM Testing Center, Korea                 CIQTEK SEM Microscope SEM3200 User FAQ by SciMed, UK