Field Emission Scanning Electron Microscope (FE-SEM) dB550

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Warranty: 1 Year
Magnification: >1000X
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  • Field Emission Scanning Electron Microscope (FE-SEM) dB550
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Basic Info.

Model NO.
DB550
Type
Stereomicroscope
Number of Cylinder
Binoculars
Mobility
Desktop
Stereoscopic Effect
Without Stereoscopic Effect
Kind of Light Source
Ordinary Light
Shape
Rectangular Prism
Usage
Research
Principle
Optics
Principle of Optics
Phase Contrast Microscope
Resolution1
0.9 Nm@15 Kv; 1.6 Nm@1 Kv
Accelerating Voltage
0.02 Kv to 30 Kv
Resolution2
3 Nm@30 Kv
Accelerating Voltage2
0.5 Kv to 30 Kv
Transport Package
Wooden Packing
Specification
1.5 CBM
Origin
China
HS Code
9012100000
Production Capacity
10000/ Year

Product Description

Field Emission Scanning Electron Microscope (FE-SEM) DB550



Product Paramenters:
       
Field Emission Scanning Electron Microscope (FE-SEM) dB550

Field Emission Scanning Electron Microscope (FE-SEM) with Focused Ion Beam (FIB) Columns

 

The CIQTEK DB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) has a focused ion beam column for nano-analysis and specimen preparation. It utilizes "super tunnel" electron optics technology, low aberration and non-magnetic objective design, and has the "low voltage, high resolution" feature to ensure its nanoscale analytical capabilities.

 

The ion columns facilitate a Ga+ liquid metal ion source with highly stable and high quality ion beams to ensure nanofabrication capabilities. The DB550 is an all-in-one nano-analysis and fabrication workstation with an integrated nano-manipulator, gas injection system, and user-friendly GUI software.

 
Product Speciffcations

 
CIQTEK FIB-SEM DB550 Specifications
Electron Optics Electron Gun Type High Brightness Schottky Field Emission Electron Gun
Resolution 0.9 nm@15 kV; 1.6 nm@1 kV
Acceleration Voltage 0.02 kV to 30 kV
Ion Beam System Ion Source Type Gallium
Resolution 3 nm@30 kV
Acceleration Voltage 0.5 kV to 30 kV
Specimen Chamber Vacuum System Fully Automatic Control, Oil-free Vacuum System
Cameras Three Cameras
(Optical navigation x1 + chamber monitor x2)
Stage Type Motorized 5-axis Mechanical Eucentric Specimen Stage
Stage Range X=110 mm, Y=110 mm, Z=65 mm

X=110 mm, Y=110 mm, Z=65 mm

T: -10°~+70°, R:360°

SEM Detectors and Extensions Standard In-lens Electron Detector
Everhart-Thornley Detector (ETD)
Optional Retractable Back-Scattered Electron Detector (BSED)
Retractable Scanning Transmission Electron Microscopy Detector (STEM)
Energy Dispersive Spectrometer (EDS/EDX)
Electron Backscatter Diffraction Pattern (EBSD)
Nano-manipulator
Gas Injection System
Plasma Cleaner
Specimen Exchange Loadlock
Trackball & Knob Control Panel
User Interface Languages English
Operating System Windows
Navigation Optical Navigation, Gesture Quick Navigation
Automatic Functions Auto Brightness & Contrast, Auto Focus, Auto Stigmator
Product Advantages
Field Emission Scanning Electron Microscope (FE-SEM) dB550
 
 HIGHLIGHTS
Field Emission Scanning Electron Microscope (FE-SEM) dB550
 APPLICATIONS
 

>> Semiconductor

In the semiconductor industry, IC chips may encounter various failures. Various methods are used to analyze the chips to improve reliability. In particular, focused ion beam (FIB) analysis is a reliable analytical technique.

Specimen Characterization / Micro-Nano Fabrication / Cross-section Analysis / TEM Specimen Preparation / Failure Analysis


Field Emission Scanning Electron Microscope (FE-SEM) dB550
 

>> New Energy Industry

Observation and analysis of material cross-sections for research and process development.

Morphology Observation / Particle Size Analysis / Cross-section Analysis / Composition and Phase Analysis / Failure Analysis of Lithium-ion Battery Material / TEM Sample Preparation


Field Emission Scanning Electron Microscope (FE-SEM) dB550

>> Ceramic Material

Material analysis: The FIB-SEM system can perform high-precision micro-nano machining and imaging of ceramic materials, combined with various signal detection modes such as backscattered electrons (BSE), energy-dispersive X-ray spectroscopy (EDX), Electron Backscattered Diffraction Pattern (EBSD), and secondary ion mass spectrometry (SIMS), to study the material in micro to nano-scale with three-dimensional space in depth.


Field Emission Scanning Electron Microscope (FE-SEM) dB550


>> Alloy Material

To increase the strength, hardness, toughness, etc., of metals, other substances such as ceramics, metals, fibers, etc., are added into the metal using methods such as metallurgy, casting, extrusion, etc., which are called reinforced phases.

TEM specimen prepared by an FIB-SEM is used to observe information such as reinforced phases and boundary atoms through transmitted electron signals. TEM specimens can be used for transmission Kikuchi Diffraction (TKD) analysis, metallographic analysis, compositional analysis, and in-situ testing of alloy cross-section.

Field Emission Scanning Electron Microscope (FE-SEM) dB550
SOFTWARE


Graphic User Interface
Field Emission Scanning Electron Microscope (FE-SEM) dB550

Highly integrated user interface platform

SEM microscope imaging and processing functions are integrated within an overall user interface, with comparative references displayed on the left and right.

 

Field Emission Scanning Electron Microscope (FE-SEM) dB550
Self-developed accessories hardware and user interfaces such as gas injection system and nano-manipulator, intuitive design of layout for easy-to-use operation.

 


 
 

 

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